International Journal of Advancements in Electronics and Electrical Engineering
Author(s) : ASFANDYAR IMTIAZ , ATTAULLAH SHAH , MASHHOOD AHMAD, SAIFULLAH AWAN
Pure and Fe+3 doped titanium dioxide thin films were prepared by sol-gel spin coating technique. Phase analysis,crystallite size, dislocation density and toughness of films were scrutinized by X-ray diffraction (XRD). The principal phase in the films was anatase. Crystallite size plummeted from 39.3 to 33.22nm whereas dislocation densities escalated from 6.47 x 10-4 to 9.06 x 10-4(nm)-3 when Fe+3 content rose from 0 to 10%. These mushroomed dislocation densities imparted strength to the films on account of grain boundary strengthening phenomenon.Principal anatase phase of the films was validated by Raman spectroscopy. Minor peak broadening and peak shifting was observed for doped films, that were attributed to the dislocation induced stresses by the rising Fe+3 content. UV-Vis spectrophotometry was undertaken to ascertain the transmittance of films in ultraviolet and visible spectrums. The films exhibited substantial transmittance in the visible region but there was a vivid landslide from 78 to 37% with elevation of Fe+3 content. In order to establish the band gap reduction in doped films, Tauc plot was utilized. Band gap abated from 3.24 to 3.08eV with burgeoning Fe+3 content from 0 to 10% so that effective photocatalytic activity can occur in the visible spectrum as well.